XPS

The Walther-Meißner-Institute will acquire an X-ray/Ultraviolet Photoelectron Spectroscopy (XPS/UPS) system for the characterization of metallic, semiconducting, and insulating thin films, and bulk materials. This includes the characterization of substrate surfaces, characterization of oxide layers by measuring the chemical shift and valence state, determining the oxide layer thickness using angle-resolved XPS, stoichiometry analysis of thin film samples, depth profiling of chemical composition, and measuring the electronic structure of different materials. The system should be operational as stand-alone system but also in connection with an existing ultra-high vacuum (UHV) MBE-PLD deposition system from DCA Instruments Oy. Therefore, fast and easy sample loading but also a reliable sample transfer between the XPS/UPS system and the DCA deposition system is required.