Imager Test System

DLR is establishing a new laboratory setup to characterize sensors under conditions relevant for planetary exploration mission. To this end, a universal imager test system for testing CMOS sensors and IR image sensors needs to be procured. The imager test system shall provide the overall functionality described in this specification. The system shall perform detector clocking (low voltage single ended, LVDS), digital data acquisition (up to four channel DDR up to 130 MHz with configurable bit length), command control (SPI with programmable vector length, variable clock frequency and configurable vector contents) and four channel analogue-digital conversion (preamplifier, 16 bits 20 MHz AD conversion and ADC power supply). The interface shall support SPI referenced control signals. Programmable low-noise bias voltage sources allow sensor specific biasing and supply voltage generation. The imager test system shall support four channel analogue video acquisition up to 25 MHz/channel sampling rate. The ADC resolution amounts 16 bit for each channel. For commanding and parameter setting of the detector the imager test system shall support SPI and I2C control interfaces. The sensor specific clocks shall be programmable by a user-friendly graphic interface (pattern generator). Further information can be found in the attached Specification of Services dated 31.10.2023 (contract documents).