High Resolution Atomic Force Microscope

Nanoscale probe system: a high-resolution atomic force microscope (AFM) suitable for opera-tion with an inverted optical microscope and as a standalone unit. In the first case, the AFM should be customized to be able to perform specific nano-optical experiments and involve a set of high-numerical aperture (NA) objectives to be employed with the custom AFM system mounted on an inverted microscope. Moreover, the AFM should be employed with liquids for experiments related to biointerfaces.